Volume 2 - Issue 1, January - February 2026

A label on any product is important for product detail feature for detecting label defects. So, using machine learning’s provided by the manufacturer. Therefore, identification of any different algorithm we are going to make label inspection system.Defects in the label is one of the important processing stages in the industry, in such as label prints, type error, angle of pasting the label and automatically rejects the product from the packaging line. A software framework that collects camera images, associates these images to individual objects and executes inspection modules to actually evaluate the images. A label with the different specification is taken and the images are evaluated using Machine Vision algorithm and the results are found satisfactory. The experiment results are presented and discussed.

Mr.Durvesh Tanavade, Mr.Krish Bowlekar, Mr.Hayden Fernandes, Mr. Darshan Thumbare, Mr. Utkarsh Girap, Mr.Kaushal Sawant, Ms.P.B.Mhadgut,"Label Inspection System Using Machine Learning" International Journal of Advanced Multidisciplinary Research and Educational Development, V2(1): Page(1440-1444) Jan-Feb 2026. ISSN: 3107-6513. www.ijamred.com. Published by Scientific and Academic Research Publishing.